At last , hemisphere reflectivity and bidirectional reflectance distribution of some samples are measured through our experimental facility , after being analzed , the results are fitted with the models developed above using genetic algorithm to get the parameters 在此基礎(chǔ)上,利用測(cè)量的實(shí)驗(yàn)數(shù)據(jù)與前面建立的模型進(jìn)行擬合,借助于遺傳算法和最優(yōu)化方法,根據(jù)建立的目標(biāo)函數(shù)反演參數(shù)。